Overlay control based on DI metrology of optical targets has been the primary basis for run-to-run process control for many years. In previous work we described a scenario where optical overlay ...

The AI solution developed by Yokogawa uses multiple, coordinated AI agents of the Factorial Kernel Dynamic Policy Programming ...

Increasingly tight tolerances and rigorous demands for quality are forcing chipmakers and equipment manufacturers to ferret out minor process variances, which can create significant anomalies in ...

Article by Christopher Honig, Muxina Konarova and John D Hedengren GenAI seems important, but it’s not always clear how to use it. A good way in is to start with what GPTs can do, then layer on your ...

Mark Sneed, director, advanced manufacturing, is pleased to announce the selection of Carl Witte to the role of manager, process control engineering. Most recently, Witte served as a regional lab ...

Business success requires an optimized mix of people, process, and technology. Too many organizations ignore or forget the middle layer—the process engineering—that brings together their teams and ...