Overlay control based on DI metrology of optical targets has been the primary basis for run-to-run process control for many years. In previous work we described a scenario where optical overlay ...

Six Sigma, a quality-control methodology first developed for manufacturing, is now used by business and organizations of all types.

Manufacturers are turning to hybrid bonding to enable the ultra-dense 3D integration required for next-generation chip ...

Process Engineering encompasses the analysis, modeling, simulation, optimization, design, control and operation of process systems, from micro-sized systems to huge industrial facilities. Many ...

Article by Christopher Honig, Muxina Konarova and John D Hedengren GenAI seems important, but it’s not always clear how to use it. A good way in is to start with what GPTs can do, then layer on your ...

Mark Sneed, director, advanced manufacturing, is pleased to announce the selection of Carl Witte to the role of manager, process control engineering. Most recently, Witte served as a regional lab ...