Abstract: This work describes a procedure for evaluating the mismatch between MOSFET transistors in a test array and connected as stacked-pairs. The transistor mismatch is characterized by measuring ...
Abstract: This paper reports on the development of the electrical test setup for microfluidic field effect transistor (FET). Testing of the device commences during the fabrication process where ...
Results that may be inaccessible to you are currently showing.
Hide inaccessible results
Feedback