Abstract: The yield distribution of a batch of wafers is an indicator of the type and behavior of defect sources in the manufacturing process. In a stable process, defects generated by these sources ...

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The extension of the theorem: ( 1 + x ) ^ n = 1 + n * x + {n (n - 1) x ^ 2 } / { 2 ! } + { n ( n - 1 ) ( n - 2 ) x ^ 3 } / { 3 ! }+..... $$ ( 1 + x ) ^ n = 1 + n ...

An approximation for negative binomial sums involving a minimum of arithmetic is presented. Because of the relationship between negative binomial sums and regular binomial sums the approximation can ...

along with the calculation of probability of obtaining a certain percentage of marks in the same. Using the data obtained from the results of a sufficiently large number of mock examinations, ...

Mathematics Department, Egerton University, Egerton, Kenya. Alternative methods for constructing confidence interval for p have been proposed, such as the Wilson Score, Clopper-Pearson and ...